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Scanning Electron Microscopy and X-Ray Microanalysis by Charles E. Lyman, Dale E. Newbury, David C. Joy, Eric Lifshin, Joseph I. Goldstein, Joseph R. Michael, Linda Sawyer, Patrick Kchlin (2002, Hardcover, Subsequent Edition)
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Author: Charles E. Lyman,Dale E. Newbury,David C. Joy,Eric Lifshin,Joseph I. Goldstein,Joseph R. Michael,Linda Sawyer,Patrick Kchlin
Publisher: Plenum Pub Corp
Publication Date: 2002-12-01
Language: English
Format: Hardcover
ISBN-10: 0306472929
ISBN-13: 9780306472923
Product ID: EPID2291968
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