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  • Scanning Electron Microscopy and X-Ray Microanalysis by Charles E. Lyman, Dale E. Newbury, David C. Joy, Eric Lifshin, Joseph I. Goldstein, Joseph R. Michael, Linda Sawyer, Patrick Kchlin (2002, Hardcover, Subsequent Edition)

Scanning Electron Microscopy and X-Ray Microanalysis by Charles E. Lyman, Dale E. Newbury, David C. Joy, Eric Lifshin, Joseph I. Goldstein, Joseph R. Michael, Linda Sawyer, Patrick Kchlin (2002, Hardcover, Subsequent Edition) 
Scanning Electron Microscopy and X-Ray Microanalysis by Charles E. Lyman, Dale E. Newbury, David C. Joy, Eric Lifshin, Joseph I. Goldstein, Joseph R. Michael, Linda Sawyer, Patrick Kchlin (2002, Hardcover, Subsequent Edition)

 
Scanning Electron Microscopy and X-Ray Microanalysis by Charles E. Lyman, Dale E. Newbury, David C. Joy, Eric Lifshin, Joseph I. Goldstein, Joseph R. Michael, Linda Sawyer, Patrick Kchlin (2002, Hardcover, Subsequent Edition)

Author: Charles E. Lyman, Dale E. Newbury, David C. Joy, Eric Lifshin, Joseph I. Goldstein, Joseph R. Michael, Linda Sawyer, Patrick Kchlin
Publisher: Plenum Pub Corp
Publication Date: 2002-12-01
Language: English
Format: Hardcover
ISBN-10: 0306472929
ISBN-13: 9780306472923
Product ID: EPID2291968
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Details
Publication Date:2002-12-01
Edition Description:Subsequent

Size
Length:689 pages
Height:10.5 in
Width:7.5 in
Thickness:2.0 in
Weight:59.8 oz

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