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Scanning Electron Microscopy and X-Ray Microanalysis by Charles E. Lyman, Dale E. Newbury, David C. Joy, Eric Lifshin, Joseph I. Goldstein, Joseph R. Michael, Linda Sawyer, Patrick Kchlin (2002, Hardcover, Subsequent Edition)
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Author: Charles E. Lyman,Dale E. Newbury,David C. Joy,Eric Lifshin,Joseph I. Goldstein,Joseph R. Michael,Linda Sawyer,Patrick Kchlin
Publisher: Plenum Pub Corp
Publication Date: 2002-12-01
Language: English
Format: Hardcover
ISBN-10: 0306472929
ISBN-13: 9780306472923
Product ID: EPID2291968
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Thank yo for a very good quality bookReview created: 10/01/08
by:
alek639san ( 2 )
The conditon of the book is great. Everything looks the same as appeared on the description. Although it quite took time to get it, but that's alright.
Review ID: 10000000008864101
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Incredibly boring and long winded.Review created: 04/07/07
by:
bakulishious ( 2 )
This book is incredible long winded, just like the professor that had me buy it. It can be informative if you have the patience to sit and read it. Even in the realm of science and engineering books, this text is extremely boring.
Review ID: 10000000003345864
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Valuable reference for SEM users
) This book provides useful information regarding all aspects of scanning electron microscopes and electron microprobe analysis. This is a good reference book for anyone who will be working with SEMs or who wants to learn how they work.
Review ID: 10000000002553053
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