| Details | | Publication Date: | 1989-09-01 | | Editor: | Israel Koren |
Industry Reviews Contains a selection of papers presented at an international workshop on [title] held Oct. 1988 in Springfield, Mass. Here, both researchers and practitioners in the field discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Annotation copyright Book News, Inc. Portland, Or. SciTech Book News
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