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Defect Recognition and Image Processing in Semiconductors and Devices (1994, Hardcover) 
Defect Recognition and Image Processing in Semiconductors and Devices (1994, Hardcover)
Publisher: Inst of Physics Pub Inc
Publication Date: 1994-05-01
Series: Institute of Physics Conference Series, 135
Language: English
Format: Hardcover
ISBN-10: 0750302941
ISBN-13: 9780750302944
Product ID: EPID250926
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Defect Recognition and Image Processing in Semiconductors and Devices (Hardcover, 1994)
Fine 0750302941 *New, NOT USED* Jacket has light surface and edge wear. Inside
Condition: Like New
 
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Defect Recognition and Image Processing in Semiconductors and Devices (Hardcover, 1994)
New in New jacket A new copy.
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Details
Publication Date:1994-05-01
Series:Institute of Physics Conference Series, 135
Editor:J. Jimenez

Size
Height:9.8 in
Width:6.8 in
Thickness:1.0 in
Weight:31.2 oz

Industry Reviews
Proceedings of the September 1993 conference on mapping defects in particular substrates and materials. Topics include silicon, compound semiconductor substrates and epilayers, tunnelling microscopy, elastic and inelastic light scattering, and photoluminescence mapping. Of interest to researchers in solid state and device physics and electrical engineering. Includes b&w photos. Annotation copyright Book News, Inc. Portland, Or.
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