• Home >
  • Buy >
  • x-ray >

  • Advances in X-Ray Analysis by Charles S. Barrett (1988, Hardcover)

Advances in X-Ray Analysis by Charles S. Barrett (1988, Hardcover) 
Advances in X-Ray Analysis by Charles S. Barrett (1988, Hardcover)
Author: Charles S. Barrett
Publisher: Kluwer Academic Pub
Publication Date: 1988-08-01
Series: ADVANCES IN X-RAY ANALYSIS
Language: English
Format: Hardcover
ISBN-10: 0306429322
ISBN-13: 9780306429323
Product ID: EPID77506
Save this productSell oneWrite a review
Portions of this page Copyright 1995 - 2009 Muze Inc. All rights reserved.
Refine search
Preferences
Distance
Please enter valid zipcode.
Please select a valid popular city.
Please enter valid zipcode or select a valid popular city.
Within miles of ZIP
1 result|Group by condition
View as 
[ Customize view ]
Sort by: 
PriceTime Left

Advances in X-Ray Analysis : Charles S. Barrett (Hardcover, 1988)
Excellent customer service. May ship from alternate location depending on your zip
Condition: Brand New
 
Watch this item
Buy It Now$150.55---
Page 1 of 1
Details
Publication Date:1988-08-01
Series:ADVANCES IN X-RAY ANALYSIS

Size
Height:9.8 in
Width:6.5 in
Thickness:1.2 in
Weight:40.0 oz

Industry Reviews
Proceedings of the 37th Annual Conference, Aug. 1988, Steamboat Springs, Colo. Papers consider the following topics: high brilliance sources/applications; XRF mathematical models and quantification; XRF applications; analysis of thin films by XRD and XRF; x-ray stress analysis; digitized XRD patterns; qualitative and quantification phase analysis diffraction applications; x-ray tomography, imaging, and topography. Annotation copyright Book News, Inc. Portland, Or.
SciTech Book News

The proceedings of the combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis, held in Hilo and Honolulu Hawaii, August 1991, comprise reports on the latest developments in international research on X-ray fluorescence and X-ray diffraction techniques. For scientists and technicians in materials science, applied spectroscopy, instrumentation, and all aspects of X-ray techniques. Annotation copyright Book News, Inc. Portland, Or.
SciTech Book News

See an error? Submit a change request

    About eBay | Announcements | Security Center | Resolution Center | eBay Toolbar | Policies | Government Relations | Site Map | Help
    Copyright © 1995-2009 eBay Inc. All Rights Reserved. Designated trademarks and brands are the property of their respective owners. Use of this Web site constitutes acceptance of the eBay User Agreement and Privacy Policy.
    eBay official time

    Error
    We're sorry, but there's been an error.
    Please try again.