Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Charles E. Fiori, Dale E. Newbury, David C. Joy, Joseph I. Goldstein, Patrick Echlin (1986, Hardcover)
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Author: Charles E. Fiori, Dale E. Newbury, David C. Joy, Joseph I. Goldstein, Patrick Echlin
Publisher: Plenum Pub Corp
Publication Date: 1986-02-01
Language: English
Format: Hardcover
ISBN-10: 0306421402
ISBN-13: 9780306421402
Product ID: EPID116524
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